Sequential diagnosis tool

Microprocessors and Microsystems

Volumn 24, Issue 4, 2000, Pages 191-197

  Zuzek A ^a   Biasizzo, A ^a   Novak, F ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COMPUTER SOFTWARE; EXPERT SYSTEMS;

SEQUENTIAL DIAGNOSIS TOOL;

COMPUTER SYSTEMS PROGRAMMING;

EID: 0343777253     PISSN: 01419331     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0141-9331(00)00073-9     Document Type: Article

References (15)

1. Brulé J.D., Johnson R.A., Kletsky E.J. Diagnosis of equipment failures. IRE Trans. on Reliab. Qual. Control. RQC-9:1960;23-34.
2. Kletsky E.J. An application of the information theory approach to failure diagnosis. IRE Trans. on Reliab. Qual. Control. RQC-9:1960;29-39.
3. R.A. Johnson, An information theory approach to diagnosis, Proceedings 6th Symposium on Reliability and Quality Control, 1960, pp. 102-109.
4. Garey M.R., Graham R.L. Performance bounds on the splitting algorithm for binary testing. Acta Informa. 3:1974;347-355.
5. Simpson W.R., Dowling C.S. WRAPLE: the weighted repair assistance program learning extension. IEEE Design Test Compu. 1986;66-73.
6. Pattipati K.R., Alexandridis M.G. Application of heuristic search and information theory to sequential fault diagnosis. IEEE Trans. Systems, Man Cybern. 20:(4):1990;872-887.
7. Pattipati K.R., Dontamsetty M. On a generalized test sequencing problem. IEEE Trans. System, Man Cybern. 22:(2):1992;392-396.
8. Yeung R.W. On noiseless diagnosis. IEEE Trans. Systems, Man Cybern. 24:(7):1994;1074-1082.
9. Hyafil L., Rivest R. Constructing optimal binary decision trees is NP-complete. Infor. Process Lett. 5:(1):1976;15-17.
10. Nilsson N.J. Principles of Artificial Intelligence. 1982;Springer, Berlin. (chap. 3, pp. 99-109).
11. Mahanti A., Bagchi A. AND/OR graph heuristic search methods. J. ACM. 32:(1):1985;28-51.
12. Biasizzo A., Žužek A., Novak F. Sequential diagnosis with asymmetrical tests. The Comput. J. 41:(3):1998;163-170.
13. Simpson W.R., Sheppard J.W. System Test and Diagnosis. 1994;Kluwer Academic, Dordrecht, MA.
14. Chang H.Y., Manning E., Metze G. Fault Diagnosis of Digital Systems. 1970;Wiley, New York.
15. J.W. Sheppard, L.A. Orlinge, Artificial intelligence exchange and service tie to all test environments (AI-ESTATE) - A new standard for system diagnostics. Proceedings of International Test Conference, 1997, pp. 1020-1029.