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Volumn 80, Issue 3, 1996, Pages 1904-1906
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Longitudinal carrier density profiling in semiconductor lasers via spectral analysis of side spontaneous emission
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0343764223
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.363005 Document Type: Article |
Times cited : (5)
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References (11)
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