Critical behavior of a random diode network

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 59, Issue 6, 1999, Pages 6513-6516

  Inui, N ^a   Kakuno, H ^a   Tretyakov, A Y ^b   Komatsu, G ^a   Kameoka, K ^a  

^a UNIVERSITY OF HYOGO   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

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ARTICLE;

EID: 0343751685     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.59.6513     Document Type: Article

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