Testing methods for SDL systems

Computer Networks

Volumn 28, Issue 12, 1996, Pages 1669-1683

  Cavalli, Ana R ^a   Chin, Byoung Moon ^b   Chon, Kilnam ^c  

^a INSTITUT NATIONAL DES TÉLÉCOMMUNICATIONS   (France)

^b Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^c Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Conformance testing; Input output finite state machine; Nondeterminism; SDL; Test generation; Test purpose; Test sequence

Indexed keywords

EID: 0343734747     PISSN: 13891286     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-7552(95)00125-5     Document Type: Article

References (6)

1. Z.120, Messages Sequence Chart (MSC), ITU-T, July 1994.
2. A. Aho, A. Dahbura, D. Lee and M. Uyar, An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours, IEEE Trans. Comm. 39 (11) (1991).
3. M.S. Chen, Y. Choi and A. Kershenbaum, Approaches utilizing segment overlap to minimize test sequences, Proc. 10th Int. IFIP Symp. on Protocol Specification, Testing and Verification, Canada, June 1990, pp. 67-84.
4. B. Chin, A.R. Cavalli and T. Macavei, Generation of test sequences from SDL specifications, Technical report, INT, France, November 1994.
5. G. Luo, G. v. Bochmann, A. Das and C. Wu, Failure-equivalent transformation of transition systems to avoid internal actions, Inform. Process. Lett. 44 (1992) 333-343.
6. M. Phalippou, Executable testers, IWPTS'93, Pau, France, September 1993.