Auger electron-threshold photoelectron coincidence spectrometer for studies of atomic and molecular dications

Measurement Science and Technology

Volumn 11, Issue 12, 2000, Pages 1697-1702

  Hikosaka, Yasumasa ^a   Penent, Francis ^b   Lablanquie, Pascal ^c   Hall, Richard ^b   Ito, Kenji ^a  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b SORBONNE UNIVERSITÉ   (France)

^c UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTRIC FIELDS; MOLECULAR SPECTROSCOPY; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; SPECTRUM ANALYSIS;

COINCIDENCE YIELDS; PHOTOELECTRON YIELDS;

SPECTROMETERS;

EID: 0343725701     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/12/307     Document Type: Article

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