Double peak phenomenon in superconducting tunnel junction x-ray detectors

Journal of Applied Physics

Volumn 85, Issue 1, 1999, Pages 595-599

  Ohkubo, M ^a   Fukuda, D ^a   Sakamoto, I ^a   Hayashi, N ^a   Martin, J ^b   Panteleit, F ^b   Huebener, R P ^b  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343711323     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369494     Document Type: Article

References (17)

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