Measurement of an electrical potential induced by normal stress applied to the interface of an ionic material at elevated temperatures

Acta Materialia

Volumn 47, Issue 12, 1999, Pages 3423-3431

  Pannikkat, A K ^a   Raj, R ^b  

^a APPLIED MATERIALS INC   (United States)

^b University of Colorado   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CREEP; CRYSTAL ORIENTATION; DIFFUSION; ELECTRODES; INTERFACES (MATERIALS); OXYGEN; SINTERING; TEMPERATURE; TENSILE STRESS; THERMAL VARIABLES MEASUREMENT; ZIRCONIA;

CHEMICAL DIFFUSION; DIFFUSION FLUX EQUATION; FUNCTIONAL CERAMICS; NORMAL STRESS;

POLYCRYSTALLINE MATERIALS;

EID: 0343680227     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00206-2     Document Type: Article

References (10)

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10. Kim B.-K., Park S.J., Hamaguchi H. J. Am. Ceram. Soc. 117:(10):1994;2648.