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Volumn 143-147, Issue , 1997, Pages 1573-1576

Application of AEM for determination of diffusivity at migrating boundaries during discontinuous precipitation and dissolution

Author keywords

Analytical electron microscopy; Diffusivity at migrating boundaries; Discontinuous dissolution; Discontinuous precipitation

Indexed keywords

DISSOLUTION; ELECTRON MICROSCOPES; GRAIN BOUNDARIES;

EID: 0343651831     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/DDF.143-147.1573     Document Type: Article
Times cited : (2)

References (13)
  • 9
    • 5244233668 scopus 로고
    • Untersuchungen zur der diskontinuierlichen Ausscheidung und Auflösung in den Systemen Ni-In, Ni-Sn, Cu-In, und Cu-Sb
    • PhD Thesis, Universität Stuttgart
    • T.H. Chuang, "Untersuchungen zur der diskontinuierlichen Ausscheidung und Auflösung in den Systemen Ni-In, Ni-Sn, Cu-In, und Cu-Sb", PhD Thesis, Universität Stuttgart 1983.
    • (1983)
    • Chuang, T.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.