Scanning force microscopy characterization of an elaidic acid monolayer prepared on a terbium-containing subphase

Langmuir

Volumn 12, Issue 15, 1996, Pages 3740-3742

  Dérue, Véronique ^a   Alexandre, Stéphane ^a   Valleton, Jean Marc ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPLEXATION; INFRARED SPECTROSCOPY; MICROSCOPIC EXAMINATION; SYNTHESIS (CHEMICAL); TERBIUM COMPOUNDS;

ELAIDIC ACID; SCANNING FORCE MICROSCOPY; SUBPHASES;

MONOLAYERS;

EID: 0343632574     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9600311     Document Type: Article

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