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Volumn 70, Issue 10, 1997, Pages 2399-2403

X-Ray Photoelectron Spectroscopic Study of Alternately Layered Zirconium and Hafnium Phosphonate Thin Films on Silicon Substrates

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EID: 0343630378     PISSN: 00092673     EISSN: None     Source Type: Journal    
DOI: 10.1246/bcsj.70.2399     Document Type: Article
Times cited : (2)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.