X-ray diffraction from pinned charge density waves

Journal De Physique. IV : JP

Volumn 9, Issue 10, 1999, Pages

  Rouziere S ^a   Ravy, S ^a   Brazovskii, S ^b   Pouget, J P ^a  

^a UNIVERSITÉ PARIS SUD   (France)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; SEMICONDUCTOR DOPING; SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS;

FRIEDEL OSCILLATIONS;

SEMICONDUCTING GLASS;

EID: 0343628711     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)

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12. S. Rouzière, S. Ravy, S. Brazovskii and J.-P. Pouget, in preparation