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Volumn 13, Issue 7, 1998, Pages 36-41

Applying independent verification and validation to the automatic test equipment life cycle

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0343578929     PISSN: 08858985     EISSN: None     Source Type: Journal    
DOI: 10.1109/62.690866     Document Type: Article
Times cited : (3)

References (7)
  • 2
    • 0030835057 scopus 로고    scopus 로고
    • A System View of VXI ATE Design
    • January
    • E. Sacher, January 1997, A System View of VXI ATE Design, Evaluation Engineering, Vol. 36, pp 42-45.
    • (1997) Evaluation Engineering , vol.36 , pp. 42-45
    • Sacher, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.