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Volumn 41, Issue 10, 1999, Pages 635-637

Applicability of computer radiography for corrosion and wall thickness measurements

(4)  Willems, P a   Vaessen, B a   Hueck, W a   Ewert, U a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0343557823     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (4)
  • 1
    • 0342687527 scopus 로고
    • Lumineszenz-Speicherfolien für die Radiographie
    • U Ewert, J Stade, U Zscherpel, M Kaling, 'Lumineszenz-Speicherfolien für die Radiographie', Materialprüfung, 37 (1995). 11-12, pp 474-478.
    • (1995) Materialprüfung , vol.37 , Issue.11-12 , pp. 474-478
    • Ewert, U.1    Stade, J.2    Zscherpel, U.3    Kaling, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.