A Linear and Compact Charge-Coupled Charge Packet Differencer/Replicator

IEEE Transactions on Electron Devices

Volumn 31, Issue 12, 1984, Pages 1784-1789

  Barker, Richard Clark ^b  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343494579     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1984.21789     Document Type: Article

References (12)

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9. — “Measurement of hole leakage and impact ionization currents in bistable metal/tunnel-oxide/semiconductor (MTOS) junctions,” IEEE Trans. Electron Devices, vol. ED-31, no. 9, pp. 1168–1174, 1984.
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