Evaluation of electromigration activation energy by means of noise measurements and MTF tests

European Solid-State Device Research Conference

Volumn , Issue , 1987, Pages 213-216

  Diligenti, A ^a   Bagnoli, P E ^a   Neri, B ^a   Specchiulli, G ^b  

^a UNIVERSITY OF PISA   (Italy)

^b TELETTRA SpA Quality and Reliability Dept ^*  (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MTF TEST; NOISE MEASUREMENTS;

EID: 0343494269     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)