(2S, SR)-tert-Butyl 2-(p-tolylsulfinylacetyl)-pyrrolidine-1-carboxylate

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 9, 1999, Pages 1605-1607

  Toscano, Rubén A ^a   Carrasco, Alejandra ^a   Ortiz, Benjamín ^a   Sánchez Obregón, Rubén ^a   Walls, Fernando ^a   Yuste, Francisco ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343491552     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199006253     Document Type: Article

References (10)

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8. Sheldrick, G. M. (1990). SHELXTL/PC User's Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
9. Sheldrick, G. M. (1997). SHELXL97. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
10. Siemens (1993). XSCANS User's Manual. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.