ICP-MS: The new standard for inorganic analysis

American Laboratory

Volumn 30, Issue 23, 1998, Pages

  Gluodenis Jr , Thomas J ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343471728     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (5)

1. Myers & Associates. Worldwide census of ICP and ICP-MS instrumentation. Feb 1998.
2. Winge RK, Peterson VJ, Fassel VA. Appl Spectrosc 1979; 13(3):206.
3. Phelps F. M.I.T. wavelength tables. Cambridge, MA: M.I.T. Press, Oct 1982.
4. Boss C, Fredeen K. Concepts, instrumentation, and techniques in inductively coupled plasma optical emission spectrometry. Norwalk, CT: Perkin-Elmer Corp., 1997, 2nd ed.
5. HP 4500 ICP-MS reliability report. ICP-MS technical brief. Wilmington, DE: Hewlett-Packard Co., Sept 1997.