The effect of secondary electrons generated in a commercial FEG-TEM on electron energy-loss spectra

Ultramicroscopy

Volumn 68, Issue 1, 1997, Pages 61-67

  McComb, D W ^a,b   Weatherly, G G ^a  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Electron energy loss spectroscopy; Field emission gun; Secondary electrons

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

FIELD-EMISSION GUN; SECONDARY ELECTRONS;

FIELD EMISSION MICROSCOPES;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; LIGHT SCATTERING; SIGNAL NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0343471580     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00017-X     Document Type: Article

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