Resonant magnetic X-ray scattering from ultrathin Ho-metal films down to a few atomic layers

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 953-957

  Schußler Langeheine C ^a   Weschke, E ^a   Grigoriev, A Yu ^a,b   Ott, H ^a   Meier, R ^a   Vyalikh, D V ^a,b   Mazumdar, Chandan ^a   Sutter, C ^c   Abernathy, D ^c   Grubel G ^c   Kaindl, G ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; FILM GROWTH; HOLMIUM; MAGNETIC THIN FILMS; MONOLAYERS; RESONANCE; TUNGSTEN; ULTRATHIN FILMS; X RAY SCATTERING;

RESONANT MAGNETIC X RAY SCATTERING (RMXS);

METALLIC FILMS;

EID: 0343462259     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00318-2     Document Type: Article

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