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Volumn 7, Issue 5, 1999, Pages 387-392

Self-aligned metallization and reactive ion etched buried base contact solar cells

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC POTENTIAL; ELECTRODES; ELECTROPLATING; EVAPORATION; MASKS; METALLIZING; METALS; REACTIVE ION ETCHING; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS; SILICON WAFERS;

EID: 0343457911     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-159X(199909/10)7:5<387::AID-PIP276>3.0.CO;2-3     Document Type: Article
Times cited : (5)

References (14)
  • 1
    • 0004780106 scopus 로고    scopus 로고
    • Low damage reactive ion etching for photovoltaic applications
    • S. Schaefer and R. Lüdemann, 'Low damage reactive ion etching for photovoltaic applications', J. Vac. Sci. Technol. A., 17(3), 749-754 (1999).
    • (1999) J. Vac. Sci. Technol. A. , vol.17 , Issue.3 , pp. 749-754
    • Schaefer, S.1    Lüdemann, R.2
  • 6
    • 84948611938 scopus 로고
    • Buried-contact silicon solar cells
    • S. Wenham, 'Buried-contact silicon solar cells', Progr. Photovolt., 1, 3 (1993).
    • (1993) Progr. Photovolt. , vol.1 , pp. 3
    • Wenham, S.1
  • 9
    • 0029325460 scopus 로고
    • The black silicon method, a universal method for determining the parameter setting of a fluorine-based reactive ion etcher in deep silicon trench etching with profile control
    • H. Jansen, M. de Boer, R. Legtenberg and M. Elwenspoek, 'The black silicon method, a universal method for determining the parameter setting of a fluorine-based reactive ion etcher in deep silicon trench etching with profile control', J. Micromech. Microeng., 5, 115 (1995).
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 115
    • Jansen, H.1    De Boer, M.2    Legtenberg, R.3    Elwenspoek, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.