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Volumn 81, Issue 21, 1998, Pages 4768-4771
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Charge fluctuations and shear stress of thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0343445261
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.81.4768 Document Type: Article |
Times cited : (5)
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References (21)
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