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Volumn 79, Issue 11, 1996, Pages 8470-8474
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Characterization of semiconductor heterojunctions using internal photoemission
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0343429305
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.362522 Document Type: Review |
Times cited : (17)
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References (15)
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