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Volumn 361, Issue 6-7, 1998, Pages 527-531

Chemical-bond analysis of nanostructured materials using near-edge fine structures (ELNES)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0343424693     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050940     Document Type: Article
Times cited : (1)

References (13)
  • 2
    • 0004832328 scopus 로고
    • Inner-shell ionization
    • Reimer L (ed) Springer, Berlin Heidelberg New York
    • Hofer F (1995) Inner-shell ionization. In: Reimer L (ed) Energy-filtering transmission electron microscopy. Springer, Berlin Heidelberg New York, pp 225-268
    • (1995) Energy-filtering Transmission Electron Microscopy , pp. 225-268
    • Hofer, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.