Measurement of sensitivity distributions of capacitance tomography sensors

Review of Scientific Instruments

Volumn 69, Issue 1, 1998, Pages 233-236

  Yang, W Q ^a   Conway, W F ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343417495     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148502     Document Type: Article

References (11)

1. W. Q. Yang, A. L. Stott, M. S. Beck, and C. G. Xie, Rev. Sci. Instrum. 66, 4326 (1995).
2. G. A. Johansen, T. Frøystein, B. T. Hjertaker, and Ø. Olsen, Meas. Sci. Technol. 7, 297 (1996).
3. S. L. McKee, T. Dyakowski, R. A. Williams, T. A. Bell, and T. Allen, Powder Technol. 82, 105 (1995).
4. G. E. Fasching and N. S. Smith, Rev. Sci. Instrum. 62, 2243 (1991).
5. S. J. Wang, T. Dyakowski, C. G. Xie, R. A. Williams, and M. S. Beck, J. Chem. Eng. 56, 95 (1995).
6. Ø. Isaksen and J. E. Nordtvedt, Meas. Sci. Technol. 4, 1464 (1993).
7. A. Y. Nooralahiyan, B. S. Hoyle, and N. J. Bailey, IEE Proc. Circuits Devices Syst. 141, 517 (1995).
8. P. M. Duggan and T. A. York, in Process Tomography - 1995 - Implementation for Industrial Processes, edited by M. S. Beck, B. S. Hoyle, M. Morris, R. C. Waterfall, and R. A. Williams (UMIST, Manchester, 1995), p. 411.
9. PC-OPERA User Guide & Reference Manual (Vector Fields, Oxford, 1993).
10. N. N. Rao, Basic Electromagnetics with Applications (Prentice-Hall, Englewood Cliffs, NJ, 1972).
11. W. Q. Yang, M. S. Beck, and M. Byars, Meas. Control 28, 261 (1995).