Effect of interface roughness and well width on differential reflection dynamics in InGaAs/InP quantum wells

Applied Physics Letters

Volumn 72, Issue 1, 1998, Pages 97-99

  Zhao, Y G ^a,b   Zou, Y H ^a,b   Wang, J J ^a,b   Qin, Y D ^a,b   Huang, X L ^a,b   Masut, R A ^c   Bensaada, A ^c  

^a PEKING UNIVERSITY   (China)

^b National Laboratory for Superlattices and Microstructures   (China)

^c ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343416002     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120656     Document Type: Article

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