Scanning probe microscopy studies of the substrate annealing effect on Y1Ba2Cu3O7-x thin film growth

Physica C: Superconductivity and its Applications

Volumn 341-348 (IV), Issue , 2000, Pages 2339-2340

  Fan, Y ^a   Fitzgerald, A G ^a   Storey, B E ^a   Tooke, A O ^a  

^a UNIVERSITY OF DUNDEE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; FILM GROWTH; HIGH TEMPERATURE EFFECTS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY;

HIGH TEMPERATURE ANNEALING; MOLECULAR IMAGING SCANNING TUNNELING MICROSCOPE;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0343397462     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01065-0     Document Type: Article

References (1)

1. D.H. Lowndes, X.Y. Zheng, S. Zhu, J.D. Budai and R.J. Warmack, 1992 Appl. Phys. Lett. 61 (1992), 852.