Superconducting and structural properties of YBCO thick films grown on biaxially oriented CeO2/NiO/Ni-V architecture

Physica C: Superconductivity and its Applications

Volumn 341-348 (IV), Issue , 2000, Pages 2501-2502

  Celentano, G ^a   Annino, C ^a   Boffa, V ^a   Ciontea, L ^a,b   Fabbri, F ^a   Gambardella, U ^a,c   Galluzzi, V ^a   Grimaldi, G ^a   Mancini, A ^a   Muzzi, L ^a   Petrisor, T ^a,b  

^a ENEA   (Italy)

^b TECHNICAL UNIVERSITY OF CLUJ NAPOCA   (Romania)

^c INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL ORIENTATION; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; NICKEL COMPOUNDS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TEMPERATURE; THICK FILMS; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

CRITICAL TEMPERATURE; DC FOUR PROBE METHOD; NICKEL OXIDE;

SUPERCONDUCTING FILMS;

EID: 0343397440     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01293-4     Document Type: Article

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