Interpretation of a microwave induced current step in a single intrinsic Josephson junction on a Bi-2223 thin film

Physica C: Superconductivity and its Applications

Volumn 341-348 (IV), Issue , 2000, Pages 2645-2648

  Helm, Ch ^a   Odagawa, A ^b   Sakai, M ^b   Adachi, H ^b   Setsune, K ^b   Kleiner, R ^c  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b PANASONIC CORPORATION   (Japan)

^c UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH ALLOYS; COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; JOSEPHSON JUNCTION DEVICES; MICROWAVES; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING FILMS; SUPERCONDUCTING TRANSITION TEMPERATURE; SUPERCONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY;

JOSEPHSON FLUXONS; MICROWAVE INDUCED CURRENT STEP; SINGLE INTRINSIC JOSEPHSON JUNCTION;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0343397372     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01435-0     Document Type: Article

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