메뉴 건너뛰기




Volumn 26, Issue 3, 2000, Pages 24-29

Finite element modelling of printed circuit boards (PCBs) for structural analysis

Author keywords

[No Author keywords available]

Indexed keywords

COPPER PLATING; FINITE ELEMENT METHOD; MANUFACTURE; MATHEMATICAL MODELS; PRINTED CIRCUIT DESIGN; PRINTED CIRCUIT TESTING; RELIABILITY; SOLDERING; STRESSES;

EID: 0343353873     PISSN: 03056120     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (13)

References (7)
  • 3
    • 0024905991 scopus 로고
    • A note on the calculation of thermal stresses in electronic packaging by finite element methods
    • Lau, J.H. (1989), "A note on the calculation of thermal stresses in electronic packaging by finite element methods", ASME Journal of Electronic Packaging, Vol. 111, pp. 313-20.
    • (1989) ASME Journal of Electronic Packaging , vol.111 , pp. 313-320
    • Lau, J.H.1
  • 4
    • 0026169569 scopus 로고
    • Asymptotic expansions for the thermal stresses in bonded semi-infinite bi-material strips
    • Lee, M. and Jasiuk (1991), "Asymptotic expansions for the thermal stresses in bonded semi-infinite bi-material strips", ASME Journal of Electronic Packaging, Vol. 113, pp. 173-7.
    • (1991) ASME Journal of Electronic Packaging , vol.113 , pp. 173-177
    • Lee, M.1    Jasiuk2
  • 5
    • 0343094887 scopus 로고    scopus 로고
    • MARC Analysis Corporation Palo Alto, CA
    • MARC Analysis Software (1996), MARC Analysis Corporation, Palo Alto, CA.
    • (1996)
  • 6
    • 0026172299 scopus 로고
    • Interfacial shear and peel stresses in multilayered thin stacks subjected to uniform thermal loading
    • Pao, Y. and Eisele, E. (1991), "Interfacial shear and peel stresses in multilayered thin stacks subjected to uniform thermal loading", ASME Journal of Electronic Packaging, Vol. 113, pp. 164-72.
    • (1991) ASME Journal of Electronic Packaging , vol.113 , pp. 164-172
    • Pao, Y.1    Eisele, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.