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Volumn 41, Issue 11, 2000, Pages 4143-4148
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Structure development in poly(ethylene terephthalate) quenched from the melt at high cooling rates: X-ray scattering and microhardness study
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Author keywords
Glassy states; Poly(ethylene terephthalate); Solidification under fast cooling
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Indexed keywords
CARRIER CONCENTRATION;
COOLING;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
GLASS;
MICROHARDNESS;
QUENCHING;
SOLIDIFICATION;
THIN FILMS;
X RAY SCATTERING;
FROZEN-IN ELECTRON DENSITY;
GLASSY POLYETHYLENE TEREPHTHALATES;
INTERNAL CHAIN ORDERING;
ISOTHERMAL COLD CRYSTALLIZATION;
MICROMECHANICAL PROPERTIES;
SMALL ANGLE X RAY SCATTERING;
WIDE ANGLE X RAY SCATTERING;
POLYETHYLENE TEREPHTHALATES;
POLYETHYLENE TEREPHTHALATE;
ANALYTIC METHOD;
ARTICLE;
COOLING;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
HARDNESS;
POSITRON EMISSION TOMOGRAPHY;
RADIATION SCATTERING;
STRUCTURE ANALYSIS;
THICKNESS;
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EID: 0343340126
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(99)00640-0 Document Type: Article |
Times cited : (25)
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References (22)
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