Annealing studies of undoped Hg1-xMnxTe bulk crystals at high temperatures

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1383-1387

  Kutcher, Susan W ^a   Poehler, T O ^a   Trivedi, Sudhir ^b   Yu, Zhengchen ^b   Vydyanath, H R ^c   Becla, P ^d  

^a JOHNS HOPKINS UNIVERSITY   (United States)

^b BRIMROSE CORPORATION OF AMERICA   (United States)

^c AEROJET ROCKETDYNE   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Annealing; Defects; HgMnTe; Long wavelength infrared (LWIR) very long wavelength infrared (VLWIR) detectors; Pressure temperature diagram

Indexed keywords

EID: 0343197593     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655038     Document Type: Article

References (9)

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