A new PC-controlled device for emittance and brightness measurements

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161-163, Issue , 2000, Pages 302-307

  Scheloske, Stefan ^a   Dürr, Werner ^a   Maetz, Mischa ^a   Pfahler, Rolf ^a   Repnow, Roland ^a   Schiebler, Hermann ^a   Traxel, Kurt ^b  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Brightness; Emittance; Ion optics; Nuclear microscopy

Indexed keywords

COMPUTER CONTROL; ION SOURCES; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; OPTICAL VARIABLES MEASUREMENT; PARTICLE BEAMS; PROTONS;

BRIGHTNESS; BRIGHTNESS MEASUREMENT; EMITTANCE; HEIDELBERG PROTON MICROPROBE; ION OPTICS; NUCLEAR MICROSCOPY; PENNING ION SOURCE;

NUCLEAR INSTRUMENTATION;

EID: 0343192408     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00817-4     Document Type: Article

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