Line feature matching technique based on an eigenvector approach

Computer Vision and Image Understanding

Volumn 77, Issue 3, 2000, Pages 263-283

  Ho Park, Sang ^a   Mu Lee, Kyoung ^b   Uk Lee, Sang ^a  

^a Seoul National University   (South Korea)

^b Hong Ik University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; EIGENVALUES AND EIGENFUNCTIONS; MATHEMATICAL MODELS; MATRIX ALGEBRA; PATTERN MATCHING;

LINE FEATURE MATCHING TECHNIQUES;

OBJECT RECOGNITION;

EID: 0343167940     PISSN: 10773142     EISSN: None     Source Type: Journal    
DOI: 10.1006/cviu.2000.0808     Document Type: Article

References (18)

1. Duda R. O., Hart P. E. Pattern Classification and Scene Analysis. 1973.
2. Schalkoff R. J. Pattern Recognition: Statistical, Structural and Neural Approaches. 1992.
3. Umeyama S. An eigendecomposition approach to weighted graph matching problems. IEEE Trans. Pattern Anal. Mach. Intell. 10:1988;696-703.
4. Rosenfeld A., Hummel R. A., Zucker S. W. Scene labeling by relaxation operations. IEEE Trans. Systems Man Cybernet. 6:1976;420-453.
5. Hummel R. A., Zucker S. W. On the foundation of relaxation labeling process. IEEE Trans. Pattern Anal. Mach. Intell. 5:1983;267-286.
6. Medioni G., Nevatia R. Matching images using linear features. IEEE Trans. Pattern Anal. Mach. Intell. 6:1984;675-685.
7. Li S. Z. Matching: Invariant to translations, rotations and scale changes. Pattern Recog. 25:1992;583-594.
8. Scott G., Longuet-Higgins H. An algorithm for associating the features of two patterns. Proc. R. Soc. London B. 244:1991;21-26.
9. Shapiro L. S., Brady J. M. Feature-based correspondence: An eigenvector approach. Image Vision Comput. 10:1992;283-288.
10. M. Pilu, A direct method for stereo correspondence based on singular value decomposition, in Proc. Computer Vision Pattern Recognition, 1997, pp. 261-266.
11. Nevatia R., Babu K. R. Linear feature extraction and description. Comput. Graphics Image Process. 13:1980;257-269.
12. Sclaroff S., Pentland P. Modal matching for correspondence and recognition. IEEE Trans. Pattern Anal. Mach. Intell. 17:1995;545-561.
13. Bathe K. Finite Element Procedures in Engineering Analysis. 1982.
14. J. Krumm, Eigenfeatures for planar pose measurement of partially occluded objects, in Proc. Computer Vision Pattern Recognition, 1996, pp. 55-60.
15. Grimson W., Lozono-Perez T. Localizing overlapping parts by searching the interpretation tree. IEEE Trans. Pattern Anal. Mach. Intell. 9:1987;469-482.
16. Golub G. H., Van Loan C. F. Matrix Computations. 1989.
17. Uenohara M., Kanade T. Use of Fourier and Karhunen-Loeve decomposition for fast pattern matching with a large set of templates. IEEE Trans. Pattern Anal. Mach. Intell. 19:1997;891-898.
18. Ohba K., Ikeuchi K. Detectability, uniqueness, and reliability of eigen windows for stable verification of partially occluded objects. IEEE Trans. Pattern Anal. Mach. Intell. 19:1997;1043-1048.