Near-field electron energy loss spectroscopy in porous silicon

Journal of Porous Materials

Volumn 7, Issue 1, 2000, Pages 159-163

  Williams, Pascal ^a   Lévy Clément, Claude ^a   Albu Yaron, Ana ^a   Brun, Nathalie ^b   Colliex, Christian ^b  

^a CNRS   (France)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; NANOSTRUCTURED MATERIALS; PARTICLES (PARTICULATE MATTER); SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; TRANSMISSION ELECTRON MICROSCOPY;

NANOHOLES; NANOPARTICLES; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

POROUS SILICON;

EID: 0343167939     PISSN: 13802224     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1009666132731     Document Type: Article

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