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Volumn 150, Issue 1-4, 1999, Pages 532-537
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On the interpretation of micro-PIXE measurements on a prototype microstructured reference material
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC WAVE EMISSION;
ION BEAMS;
IRON ALLOYS;
NICKEL ALLOYS;
MICROSTRUCTURED REFERENCE MATERIAL;
SCANNING NUCLEAR MICROPROBE;
X RAYS;
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EID: 0343164315
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(98)01073-8 Document Type: Article |
Times cited : (5)
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References (8)
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