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Volumn 814, Issue , 1987, Pages 307-313
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Moiré topography with large contour intervals
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Author keywords
[No Author keywords available]
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Indexed keywords
HOLOGRAPHY;
INTERFEROMETRY;
PHASE MEASUREMENT;
SPECKLE;
STRESS INTENSITY FACTORS;
CONTINUOUS SURFACE;
FRINGE PATTERN;
FRINGE PATTERN ANALYSIS;
HIGH-ACCURACY;
MEASUREMENTS OF;
MEASURING TECHNIQUE;
PHASE CALCULATION;
TOPOGRAPHY;
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EID: 0343144100
PISSN: 0277786X
EISSN: 1996756X
Source Type: Conference Proceeding
DOI: 10.1117/12.941713 Document Type: Conference Paper |
Times cited : (13)
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References (6)
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