Interferometric measurement of refractive index profiles for thin film characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3098, Issue , 1997, Pages 442-449

  Sheppard, Colin J R ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-PASS; INTERFEROMETRIC MEASUREMENT; LASER INTERFEROMETRIC; MEASUREMENT OF REFRACTIVE INDEX PROFILE; MULTIPLE REFLECTIONS; REFRACTIVE INDEX PROFILES; REFRACTIVE INDEX VARIATIONS; THIN-FILM CHARACTERIZATION; THIN-FILM STRUCTURE; THREE DIMENSIONAL IMAGES;

HIGH PASS FILTERS; LASER INTERFEROMETRY; LIGHT REFRACTION; OPTICAL SYSTEMS; OPTICAL TESTING; REFRACTIVE INDEX; REFRACTOMETERS; SINGLE MODE FIBERS; THIN FILMS;

THREE DIMENSIONAL;

EID: 0343103891     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.281190     Document Type: Conference Paper

References (4)

1. Greenewald, C. H., Bradt, W. and Friel, D. D. "Irridescent colors of hummingbird feathers," J. Opt. Soc. Amer. 50, 1005-1013 (1960)
2. Sheppard, C. J. R., and Gu, M., "Modeling of 3-D brightfield microscope systems," Proc. SPIE, 2302, 352-358, (1994).
3. Sheppard, C. J. R., Connolly, T. J., Lee, J., and Cogswell, C., "Confocal imaging of a stratified medium," Appl. Opt. 33, 631-640, (1994).
4. Sheppard, C. J. R., "Approximate calculation of the reflection coefficient from a stratified medium," Pure Appl. Opt. 4, 665-669 (1995)