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Volumn 76, Issue 1-3, 1999, Pages 386-394

Finite element analysis of the open window plastic package for optical sensors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; HIGH TEMPERATURE EFFECTS; MATHEMATICAL MODELS; STRESS ANALYSIS; SURFACE MOUNT TECHNOLOGY;

EID: 0343060860     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00036-9     Document Type: Article
Times cited : (2)

References (9)
  • 5
    • 0342432067 scopus 로고
    • Computer Aided Stress Modeling for Optimizing Plastic Package Reliability
    • Groothuis S., Schroen W., Murtuza M. Computer Aided Stress Modeling for Optimizing Plastic Package Reliability. IEEE/IPRS. 9:1985;186.
    • (1985) IEEE/IPRS , vol.9 , pp. 186
    • Groothuis, S.1    Schroen, W.2    Murtuza, M.3
  • 6
    • 0343737171 scopus 로고
    • Test structure and finite element models for chip stress and plastic package reliability
    • Pendse R., Demmin J. Test structure and finite element models for chip stress and plastic package reliability. IEEE Trans. CHMT. 3:1990;155-156.
    • (1990) IEEE Trans. CHMT , vol.3 , pp. 155-156
    • Pendse, R.1    Demmin, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.