The influence of true simultaneous internal standardization and background correction on repeatability for laser ablation and the slurry technique coupled to ICP emission spectrometryf

Journal of Analytical Atomic Spectrometry

Volumn 14, Issue 4, 1999, Pages 597-602

  Nolte, Joachim ^a,d   Schefller, Franziska ^a,b   Mann, Sabine ^a,b,c   Paul, Michael ^a,b,c,d  

^a Bodenseewerk Perkin Elmer GmbH   (Germany)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^c TU DORTMUND UNIVERSITY   (Germany)

^d Perkin Elmer Deutschland   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; LASER ABLATION; PLASMA APPLICATIONS; SAMPLING; SLURRIES; SPECTROMETERS;

INDUCTIVELY-COUPLED PLASMAS (ICP); SOLID SAMPLING;

SPECTROMETRY;

EID: 0343053333     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/A808591I     Document Type: Article

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