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Volumn 385, Issue 1-2, 2001, Pages 275-280

Elastic and anelastic properties, internal stress and thermal expansion coefficient of cubic boron nitride films on silicon

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELASTIC MODULI; HEAT TREATMENT; INTERNAL FRICTION; RESIDUAL STRESSES; SILICON; SPECTROSCOPY; SPUTTER DEPOSITION; THERMAL EXPANSION; THIN FILMS;

EID: 0343026476     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01910-6     Document Type: Article
Times cited : (16)

References (44)
  • 29
    • 0344234931 scopus 로고    scopus 로고
    • C.R. Abernathy, W.D. Brown, D.N. Buckley, J.P. Dismukes, M. Kamp, T.D. Moustakas, S.J. Pearton, F. Ren (Eds.), The Electrochem. Soc. Ine, Pennington, NJ
    • K. Bewilogua, A. Schütze, H. Walter, S. Kouptsidis, in: C.R. Abernathy, W.D. Brown, D.N. Buckley, J.P. Dismukes, M. Kamp, T.D. Moustakas, S.J. Pearton, F. Ren (Eds.), Proc. 2 Symp. III-V Nitride Materials and Processes 97-34, The Electrochem. Soc. Ine, Pennington, NJ, 1998, p. 134.
    • (1998) Proc. 2 Symp. III-V Nitride Materials and Processes 97-34 , pp. 134
    • Bewilogua, K.1    Schütze, A.2    Walter, H.3    Kouptsidis, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.