Irradiation-induced failure of diamond based UV detector

Crystal Research and Technology

Volumn 34, Issue 1, 1999, Pages 133-140

  Wei, J ^a,c   Ahn, J ^b  

^a CHARTERED SEMICONDUCTOR MANUFACTURING LTD   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342987694     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4079(199901)34:1<133::AID-CRAT133>3.0.CO;2-H     Document Type: Article

References (10)

1. AHN J., TAN F. H., TAN H. S., J.: Mat. Sci. Lett., 12 (1993) 775
2. AMERASEKERA E. A. in: "Failure Mechanisms in Semiconductor devices", Wiley, 1987
3. BAZHENOV V. K., VIKULIN I. M. and GONTAR A. G. in: Sov. Phys. Semicon., 19 (1985) 829
4. BINARI S. C., MARCHYWKA M., KOOLBECK D. A., DIETRICH H. B. and MOSES D. in: Dia. and Rel. Mat., 2 (1993) 1020
5. BURGEMEISTER E. A. in: Physica, 111B (1981) 319
6. FIELD J. E. in: "The Properties of Diamonds", Academic Press, 1979
7. KANIA D. R., LANDSTRASS M. I., PLANO M. A., PAN L. S. and HAN S. in: Dia. and Rel. Mat., 2 (1993) 1012
8. MEIER R. R. in: Space Sci. Rev., 58 (1991) 1
9. PAN L. S. and KANIA D. R. in: "Diamond: Electronic Properties and Applications", Kluwer Academic Publishers, 1995
10. SOOLE J. B. D. and SCHUMACHER H. in: IEEE J. Quantum Electron., 27 (1991) 737