Structural study of Ni80Fe20/Cu multilayers by X-ray diffraction

Thin Solid Films

Volumn 375, Issue 1-2, 2000, Pages 205-209

  Xu, Ming ^a   Chai, Chunlin ^a   Luo, Guangming ^a   Yang, Tao ^a   Mai, Zhenhong ^a   Lai, Wuyan ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; COPPER; CRYSTAL MICROSTRUCTURE; FILM GROWTH; MAGNETIC FILMS; MAGNETRON SPUTTERING; METALLIC SUPERLATTICES; MULTILAYERS; NICKEL ALLOYS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

NICKEL IRON ALLOYS;

METALLIC FILMS;

EID: 0342973154     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01236-0     Document Type: Article

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