Preparation and characterization of solar selective SnOx:F coated aluminum reflector surfaces

Thin Solid Films

Volumn 374, Issue 1, 2000, Pages 1-9

  Mwamburi, Mghendi ^a   Wäckelgård, Ewa ^b   Roos, Arne ^b  

^a MOI UNIVERSITY   (Kenya)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; FILM PREPARATION; HALL EFFECT; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SOLAR RADIATION; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

SPECTRALLY SELECTIVE REFLECTORS;

OPTICAL FILMS;

EID: 0342973142     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01045-2     Document Type: Article

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