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Volumn 341-348 (IV), Issue , 2000, Pages 2727-2728
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Bicrystal grain boundary Josephson junctions with epitaxial Tl2Ba2CaCu2Ox thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRITICAL CURRENTS;
ELECTRON DEVICE MANUFACTURE;
EPITAXIAL GROWTH;
GRAIN BOUNDARIES;
MAGNETRON SPUTTERING;
OXIDE SUPERCONDUCTORS;
SQUIDS;
STRONTIUM COMPOUNDS;
SUPERCONDUCTING FILMS;
THALLIUM COMPOUNDS;
THERMAL EFFECTS;
BICRYSTAL GRAIN BOUNDARY JOSEPHSON JUNCTION;
POST ANNEALING PROCESS;
STRONTIUM TINATE;
TEMPERATURE DEPENDENCE;
THALLIUM BARIUM CALCIUM CUPRATES;
JOSEPHSON JUNCTION DEVICES;
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EID: 0342961932
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(00)01458-1 Document Type: Article |
Times cited : (4)
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References (9)
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