Experimental study of nonlinear transition shift and error rate degradation caused by thermal decay

Journal of Applied Physics

Volumn 85, Issue 8 II B, 1999, Pages 5309-5311

  Taratorin, A ^a   Cheng, D ^a   Marinero, E ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342958059     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369863     Document Type: Article

References (5)

1. S. H. Charap, P. Lu, and Y. He, IEEE Trans. Magn. 33, 978 (1997).
2. S. H. Charap, J. Appl. Phys. 64, 2054 (1998).
3. Y. Hosoe, T. Kanbe, and K. Tanahashi, INTERMAG 98, San Francisco CA, 1998.
4. J. Zhu and H. N. Bertram, J. Appl. Phys. 63, 3248 (1988).
5. A. Taratorin, "Characterization of Magnetic Recording Systems", Guzik Technical Enterprises, 1996.