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Volumn 9 I, Issue 8, 1999, Pages
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In-situ monitoring of atmospheric pressure tin oxide CVD using coherent anti-Stokes Raman scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL REACTORS;
CHEMICAL VAPOR DEPOSITION;
FREE RADICALS;
GLASS;
NEODYMIUM LASERS;
ORGANIC COMPOUNDS;
OXYGEN;
PRESSURE;
RAMAN SCATTERING;
TEMPERATURE;
TIN COMPOUNDS;
WATER;
ATMOSPHERIC PRESSURE CHEMICAL VAPOR DEPOSITION;
COHERENT ANTI STOKES RAMAN SCATTERING;
TIN OXIDE;
VIBRATION ROTATION STRUCTURE;
METALLIC FILMS;
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EID: 0342955020
PISSN: 11554339
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1051/jp4:1999806 Document Type: Article |
Times cited : (2)
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References (9)
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