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Volumn 14, Issue 4, 1996, Pages 2872-2881

Contactless capacitance-voltage and photoluminescence characterization of ultrathin oxide-silicon interfaces formed on hydrogen terminated (111) surfaces

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0342950964     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588847     Document Type: Article
Times cited : (5)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.