Electronic band structure of ZnSe(100)

Surface Science

Volumn 454, Issue 1, 2000, Pages 477-482

  Droge H ^a   Nagelstrasser M ^a   Nurnberger J ^a   Faschinger, W ^a   Fleszar, A ^a   Steinruck H P ^a,b  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BAND STRUCTURE; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SUBSTRATES; SYNCHROTRONS; VACUUM APPLICATIONS;

ANGLE RESOLVED ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; ZINC SELENIDE;

SURFACE PHENOMENA;

EID: 0342906549     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00153-9     Document Type: Article

References (14)

1. Haase M.A., Qui J., DePuydt J.M., Cheng H. Appl. Phys. Lett. 59:1991;1272.
2. Ishibashi A. IEEE J.Selected Topics Quantum. Electron. 1:1995;741.
3. Landwehr G., Hommel D. Phys. Blätter. 50:(2):1994;160.
4. Hommel D., Kurtz E., Behr T., Jakobs A., Jobst B., Scholl S., Schüll K., Beyersdorfer V., Landwehr G., Cerva H. J. Cryst. Growth. 138:1994;1076.
5. Shahzad K., Petruzzello J., Gaines J.M., Ponzoni C. Appl. Phys. Lett. 67:1995;659.
6. Qu H., Kanski J., Nilsson P.O., Karlsson U.O. Phys. Rev. B. 44:1991;1762.
7. Zhang Y., Xue J.Y., Con Foo J.A., Stampfl A.P.J., Wolfframm D., Evans D.A., Riley J.D., Leckey R.C.G., Ziegler A., Mattern B., Graupner R., Hollering M., Denecke R., Ley L. Surf. Sci. 377:1997;288.
8. Riley J.D., Leckey R.C.G. Solid Mater. Sci. 17:1992;307.
9. Engelhardt H.A., Zartner A., Menzel D. Rev. Sci. Instrum. 52:1981;1161.
10. Engelhardt H.A., Bäck W., Menzel D., Liebl H. Rev. Sci. Instrum. 52:1981;835.
11. Hohenberg P., Kohn W. Phys. Rev. 136:1965;B864.
12. Kohn W., Sham L.J. Phys. Rev. 140:1965;A1133.
13. Bachelet G.B., Hamann D.R., Schlüter M. Phys. Rev. B. 26:1982;4199.
14. Lunz U., Kuhn J., Goschenhofer F., Schüssler U., Einfeldt S., Becker C.R., Landwehr G. J. Appl. Phys. 80:1996;6861.