Analytical modeling of oxide thickness effects on residual stresses in thermal barrier coatings

Scripta Materialia

Volumn 42, Issue 8, 2000, Pages 781-787

  Hsueh, C H ^a   Fuller, E R ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; COMPUTER SIMULATION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; PLASMA SPRAYING; RESIDUAL STRESSES; TENSILE STRESS; THERMAL EXPANSION; THERMAL STRESS;

THERMAL BARRIER COATING; THICKNESS EFFECT;

SPRAYED COATINGS;

EID: 0342906504     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(99)00430-3     Document Type: Article

References (9)

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6. C. H. Hsueh, and E. R. Fuller, unpublished work.
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9. C. H. Hsueh, P. F. Becher, and E. Y. Sun, J. Mater. Sci. submitted.