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Volumn 42, Issue 9, 2000, Pages 917-922

Compensation effect in creep of conventional polycrystalline alloy 718

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CREEP; CRYSTAL MICROSTRUCTURE; DIFFUSION IN SOLIDS; GRAIN BOUNDARIES; OPTICAL MICROSCOPY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0342906502     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00314-6     Document Type: Article
Times cited : (7)

References (19)
  • 12
    • 0009082351 scopus 로고    scopus 로고
    • ed. R. D. Kissinger, D. J. Deye, D. L. Anton, A. D. Cetel, M. V. Nathal, T. M. Pollock, and D. A. Woodford, TMS, Warrendale, PA
    • W. D. Cao and R. L. Kennedy, in Superalloys 1996, ed. R. D. Kissinger, D. J. Deye, D. L. Anton, A. D. Cetel, M. V. Nathal, T. M. Pollock, and D. A. Woodford, p. 589, TMS, Warrendale, PA (1996).
    • (1996) In Superalloys 1996 , pp. 589
    • Cao, W.D.1    Kennedy, R.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.